Instruments for sample preparation

instruments for sample cutting, polishing, etc... 

not available, will be established soon

Available Electron Microscopes

SEM:

- JEOL JSM-7500F (category SEM)

- ZEISS Crossbeam 550 (category FIB/SEM, advanced equipment)

TEM: 

- JEOL JEM-1400 plus (category TEM, entry-level)

- Cs-corrected Titan Krios G2 (category cryo-TEM, facility experts only)

- Glacios (category cryo-TEM, advanced aquipment)