Hard Matter

Soft Matter (Cryo- and Volume EM) 

•Instrumentation:

TEM:

-JEOL JEM1400 plus 

•Instrumentation:

TEM:

-Titan Krios G2 

-JEOL JEM1400 plus 

-Glacios (TUM-Helmholtz Cryo EM Center)

SEM:

-JEOL JSM 7500F

SEM:

-ZEISS Crossbeam 550 

•Techniques:

• High-resolution electron microscopy (TEM/STEM)

• Energy Dispersive X-Ray spectroscopy (EDX)

• Electron Energy Loss Spectroscopy (EELS) 

• Selected Area Electron Diffraction (SAED)

• ePDF (pair distributiion function based on the electron diffraction)

• 4DSTEM

In-situ Electron Microscopy

•Techniques:

• Single particle analysis

• Tomography

• FIB-SEM for high-resolution Volume EM

• FIB-SEM for S/TEM lamella preparation

• High-resolution 2D scanning electron microscopy

• Energy Dispersive X-ray spectroscopy (EDX)

• Array tomography for Volume EM